X-ray Detectors Based on Halide Perovskite Materials

Abstract

Halide perovskite has remarkable optoelectronic properties, such as high atomic number, large carrier mobility-lifetime product, high X-ray attenuation coefficient, and simple and low-cost synthesis process, and has gradually developed into the next-generation X-ray detection materials. Halide perovskite-based X-ray detectors can improve the sensitivity and reduce the detectable X-ray dose, which is applied in imaging, nondestructive industrial inspection, security screening, and scientific research. In this article, we introduce the fabrication methods of halide perovskite film and the classification and progress of halide perovskite-based X-ray detectors. Finally, the existing challenges are discussed, and the possible directions for future applications are explored. We hope this review can stimulate the further improvement of perovskite-based X-ray detectors.