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Journal ArticleOPEN ACCESS

Investigation of the GaP/Si Interface by High-Resolution Scanning Transmission Electron Microscopy

  • Beyer A
  • Ohlmann J
  • Luysberg M
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 1390-1391
DOI: 10.1017/s1431927611007823
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Beyer, A., Ohlmann, J., Luysberg, M., & Volz, K. (2011). Investigation of the GaP/Si Interface by High-Resolution Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 17(S2), 1390–1391. https://doi.org/10.1017/s1431927611007823

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