Secondary Extinction Correction Used in Pole Density Measurements by X‐Ray Diffraction

Abstract

A new X‐ray diffraction method for a more accurate determination of film pole densities is developed by introducing a secondary extinction correction. To this end an equation based on the kinematic theory of X‐ray diffraction and the mosaic crystal model is derived. Pole densities were computed either by using the two order reflections techniques or by the least‐square method. The discussion of results shows that the correct study of film structure by X‐ray diffraction requires in general the secondary extinction to be taken into account.