Testing embedded systems from multi-output domain perspective

ISSN: 22773878
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Abstract

The Modern embedded systems must be highly reliable and if not the products cannot even reach the market. Testing of embedded systems must be carried from multiple perspectives which include Input Domain, Output domain, Input-Output domain, Multi-Input domain, and Multi-output domain to ensure that the embedded systems are thoroughly tested. That will ensure delivery fail free embedded systems.. Sometimes the outputs generated which are either internal or external by an embedded system are interdependent and sometimes occur as a vector of outputs. Embedded systems must be tested for proper occurrence of designed outputs in the order and the sequence expected. Test cases are to be generated that will verify whether the outputs are occurring in the order and the sequence expected. In this Paper an algorithm and approach has been presented for generating test cases that when tested leads to testing embedded systems comprehensively ensuring that the outputs occur in the order and sequence expected.

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APA

Sasi Bhanu, J., Sastry, J. K. R., & Lakshmi Prasad, M. (2019). Testing embedded systems from multi-output domain perspective. International Journal of Recent Technology and Engineering, 8(1), 3106–3113.

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