High pressure is one of the most valuable characterization tools available in semiconductor research. In this chapter, we show how it has been used directly to measure some of the fundamental properties of materials and also to investigate electronic and optoelectronic devices, resulting in improved theoretical models of material properties and optimized device performance. We hope that the examples we give and the experimental methods we describe will inspire others to use this powerful but underused research technique.
CITATION STYLE
Prins, A., Adams, A., & Sweeney, S. (2012). Pressure Studies. In Springer Series in Materials Science (Vol. 150, pp. 171–195). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-642-23351-7_6
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