Structured illumination microscopy and image scanning microscopy: A review and comparison of imaging properties

Abstract

Structured illumination microscopy and image scanning microscopy are two microscopical tech-niques, rapidly increasing in practical application, that can result in improvement in transverse spatial resolution, and/or improvement in axial imaging performance. The history and principles of these techniques are reviewed, and the imaging properties of the two methods compared. This article is part of the Theo Murphy meeting issue 'Super-resolution structured illumination microscopy (part 1)'.