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On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model

Computer (2022) 55(9) 99-106
DOI: 10.1109/MC.2022.3187810
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Abstract

How to understand the dependability concerning electrical/electronic (E/E) product development? We introduce an essential answer that can be perceived as the first step toward a novel approach for dependable E/E product development, called the dual-cone V-model.

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APA

Bauer, B., Ayache, M., Mulhem, S., Nitzan, M., Athavale, J., Buchty, R., & Berekovic, M. (2022). On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model. Computer, 55(9), 99–106. https://doi.org/10.1109/MC.2022.3187810

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