Electronic reconstruction at n -type SrTiO3/LaAlO 3interfaces

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Abstract

Electron-energy-loss spectroscopy (EELS) is used to investigate single layers of LaAlO3 grown on SrTiO3 having an n -type interface as well as multilayers of LaAlO3and SrTiO3in which both n - and p -type interfaces occur. Only minor changes in Ti valence at the n -type interface are observed. This finding seems to contradict earlier experiments for other SrTiO3/ LaAlO3systems where large deviations in Ti valency were assumed to be responsible for the conductivity of these interfaces. Ab initio calculations have been carried out in order to interpret our EELS results. Using the concept of Bader charges, it is demonstrated that the so-called polar discontinuity is mainly resolved by lattice distortions and to a far lesser extent by changes in valency for both single layer and multilayer geometries. © 2010 The American Physical Society.

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Verbeeck, J., Bals, S., Kravtsova, A. N., Lamoen, D., Luysberg, M., Huijben, M., … Van Tendeloo, G. (2010). Electronic reconstruction at n -type SrTiO3/LaAlO 3interfaces. Physical Review B - Condensed Matter and Materials Physics, 81(8). https://doi.org/10.1103/PhysRevB.81.085113

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