Determination of Half Value Layer (HVL) Value on X-Rays Radiography with using Aluminum, Copper and Lead (Al, Cu, and Sn) Attenuators

Abstract

Half Value Layer (HVL) has done on X-rays using Aluminum (Al), Copper (Cu) and Tin (Sn) at University Hospital of North Sumatera. The method used is based on BAPETEN Regulation No.09 of 2011 and Standard Western Australia. From the results of research conducted on X-ray plane obtained the result of measurement of Half Value Layer (HVL) value by using Aluminum (Al) at 50 kVp - 90 kVp, with strong current of 20 mAs, obtained HVL thickness on Aluminum 50 kVp = 3.0 mm Al, 60 kVp = 4.0 mm Al, 70 kVp = 5.0 mm Al, 81 kVp = 5.6 mm Al and 90 kVp = 6.1 mm Al. By using Copper (Cu) at a voltage of 50 kVp = 0.05 mm Cu, 60 kVp = 0.15 mm Cu, 70 kVp = 0.2 mm Cu, 81 kVp = 0.3 mm Cu and 90 kVp = 0.3 mm Cu. By using Tin (Sn) at a voltage of 50 kVp = 0.05 mm Sn, 60 kVp = 0.05 mm Sn, 70 kVp = 0.05 mm Sn, 81 kVp = 0.05 mm Sn and 90 kVp = 0.05 mmSn. From the results of this study found that of the three types of attenuator, the best as an attenuator for Half Value layer (HVL) for X-ray plane is Aluminum (Al) and Copper (Cu). For Tin type Attenuator (Sn) is not suitable as an attenuator to measure HVL on an X-ray plane at a voltage of 50 kVp - 90 kVp.