Analysis of Thin Films on Metal Surfaces

Abstract

External reflection infrared spectroscopy was used in combination with other surface analysis techniques such as ellipsometry, Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS) to determine the structure of organofunctional silanes adsorbed onto 2024 aluminum and titanium-6 Al, 4V mirrors. The results obtained indicated that the adsorption of y-aminopropyltriethoxysilane (y-APS) onto aluminum was a strong function of pH and adsorption time. Films formed by adsorption of y-APS at pH = 8.5 were composed of polysiloxanes containing amine hydrochlorides. The structure of films formed by adsorption of y-APS at pH = 10.4 depended on time. Films obtained after one minute were composed of polysiloxanes that did not interact strongly with the oxide but during 15 minutes adsorption the air-formed oxide was dissolved and copper accumulated near the surface of the mirrors. Films formed by the adsorption of y-glycidoxypropyltrimethoxysilane (y-GPS) onto aluminum were composed of polysiloxanes that did not interact strongly with the oxide. The structure of films formed by adsorption of y-APS onto titanium did not depend on adsorption time. Films formed at pH = 10.4 were composed of low molecular weight oligomers that gradually polymerized to polysiloxanes during atmospheric exposure. © 1981, Taylor & Francis Group, LLC. All rights reserved.