Afterpulsing noise in InGaAs/InP single photon avalanche photodiodes (APDs) is caused by carrier trapping and can be suppressed successfully through limiting the avalanche charge via sub-nanosecond gating. Detection of faint avalanches requires an electronic circuit that is able to effectively remove the gate-induced capacitive response while keeping photon signals intact. Here we demonstrate a novel ultra-narrowband interference circuit (UNIC) that can reject the capacitive response by up to 80 dB per stage with little distortion to avalanche signals. Cascading two UNIC’s in a readout circuit, we were able to enable a high count rate of up to 700 MC/s and a low afterpulsing of 0.5 % at a detection efficiency of 25.3 % for 1.25 GHz sinusoidally gated InGaAs/InP APDs. At a temperature of -30 ∘ C, we measured an afterpulsing probability of 1 % at a detection efficiency of 21.2 %.
CITATION STYLE
Fan, Y., Shi, T., Ji, W., Zhou, L., Ji, Y., & Yuan, Z. (2023). Ultra-narrowband interference circuits enable low-noise and high-rate photon counting for InGaAs/InP avalanche photodiodes. Optics Express, 31(5), 7515. https://doi.org/10.1364/oe.478828
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