Optical and structural characterization of cd-free buffer layers fabricated by chemical bath deposition

Abstract

Chemical bath deposition (CBD) is a suitable, inexpensive, and versatile synthesis technique to fabricate different semiconductors under soft conditions. In this study, we deposited Zn(O;OH)S thin films by the CBD method to analyze the effect of the number of thin film layers on structural and optical properties of buffer layers. Thin films were characterized by X-ray diffraction (XRD) and UV-Vis transmittance measurements. Furthermore, we simulated a species distribution diagram for Zn(O;OH)S film generation during the deposition process. The optical results showed that the number of layers determined the optical transmittance of buffer layers, and that the transmittance reduced from 90% (with one layer) to 50% (with four layers) at the visible range of the electromagnetic spectrum. The structural characterization indicated that the coatings were polycrystalline (α-ZnS and β-Zn(OH)2 to four layers). Our results suggest that Zn(O;OH)S thin films could be used as buffer layers to replace CdS thin films as an optical window in thin-film solar cells.