Skip to main content
Conference Proceedings

Fatigue crack length measurement method with an ion sputtered film

Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture (2006) 437-438
DOI: 10.1007/1-4020-4972-2_216
6Citations
Citations of this article
4Readers
Mendeley users who have this article in their library.
Get full text

Cite

CITATION STYLE

APA

Deng, G., Nasu, K., Redda, T. D., & Nakanishi, T. (2006). Fatigue crack length measurement method with an ion sputtered film. In Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture (pp. 437–438). Kluwer Academic Publishers. https://doi.org/10.1007/1-4020-4972-2_216

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free