A two-dimensional simulation of intrinsic top-contact field-effect transistor is presented. The simulated structure is unique to organic transistors and hence is most relevant. By time resolving the operation of such a transistor, the mechanisms underlying its operation are resolved. The effect of this device configuration on the measured "intrinsic" material properties is also discussed and shown to explain previously reported features. © 2001 American Institute of Physics.
CITATION STYLE
Tessler, N., & Roichman, Y. (2001). Two-dimensional simulation of polymer field-effect transistor. Applied Physics Letters, 79(18), 2987–2989. https://doi.org/10.1063/1.1415374
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