Multiscale modelling of damage and fracture processes in nanomaterials

Abstract

The common multiscale evolution approach to structural modelling of the damage accumulation and fracture processes of submicrocrystalline materials is considered. The method of scanning probe microscopy has been applied to describe the damage evolution on nanoscale. The small-sized plane deformation specimens have been loaded in the tensile device integrated in the scanning probe microscope. The multifractal analysis has been used for the quantitative characterization of in situ deformation of the surface by means of scaling properties. To reveal the mechanism of low-temperature fracture the atomic-force microscopy has been applied to characterize the surface morphology of the stretching deformations of samples fractured at different temperatures. © Published under licence by IOP Publishing Ltd.