Sensitive Direct Converting X-Ray Detectors Utilizing Crystalline CsPbBr3 Perovskite Films Fabricated via Scalable Melt Processing

Abstract

Here the fabrication of an inorganic metal-halide perovskite CsPbBr3 based X-ray detector is reported utilizing a simple, scalable, and cost-sensitive melt processing directly on substrate of any size. X-ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm2 range. The CsPbBr3 film features a resistance of 8.5 GΩ cm and a hole mobility of 18 cm2 V−1 s−1. An X-ray to current conversion rate of 1450 mC Gyair−1 cm−2 at an electric field of 1.2 × 104 V cm−1 and a detection limit in the sub µGyair s−1 regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr3 films are suggested to be responsible for a performance which is on par to current state-of-the-art Cd(Zn)Te based X-ray detector technology.