Abstract
In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out. © 2007 American Institute of Physics.
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CITATION STYLE
Horcas, I., Fernández, R., Gómez-Rodríguez, J. M., Colchero, J., Gómez-Herrero, J., & Baro, A. M. (2007). WSXM: A software for scanning probe microscopy and a tool for nanotechnology. Review of Scientific Instruments, 78(1). https://doi.org/10.1063/1.2432410
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