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Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices

  • Zuo J
  • Zhu X
Microscopy and Microanalysis (2021) 27(S1) 762-763
DOI: 10.1017/s1431927621003044
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Abstract

… diffraction pattern (DP) indexing and identification of crystal … Automatic DP indexing is usually achieved by comparing an … the vector-based approach, where indexing is based on the DP …

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Zuo, J.-M., & Zhu, X. (2021). Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices. Microscopy and Microanalysis, 27(S1), 762–763. https://doi.org/10.1017/s1431927621003044

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