Comprehensive evaluation of the high-resolution diode array for SRS dosimetry

Abstract

A high-resolution diode array has been comprehensively evaluated. It consists of 1013 point diode detectors arranged on the two 7.7 × 7.7 cm2 printed circuit boards (PCBs). The PCBs are aligned face to face in such a way that the active volumes of all diodes are in the same plane. All individual correction factors required for accurate dosimetry have been validated for conventional and flattening filter free (FFF) 6MV beams. That included diode response equalization, linearity, repetition rate dependence, field size dependence, angular dependence at the central axis and off-axis in the transverse, sagittal, and multiple arbitrary planes. In the end-to-end tests the array and radiochromic film dose distributions for SRS-type multiple-target plans were compared. In the equalization test (180° rotation), the average percent dose error between the normal and rotated positions for all diodes was 0.01% ± 0.1% (range −0.3 to 0.4%) and −0.01% ± 0.2% (range −0.9 to 0.9%) for 6 MV and 6MV FFF beams, respectively. For the axial angular response, corrected dose stayed within 2% from the ion chamber for all gantry angles, until the beam direction approached the detector plane. In azimuthal direction, the device agreed with the scintillator within 1% for both energies. For multiple combinations of couch and gantry angles, the average percent errors were −0.00% ± 0.6% (range: −2.1% to 1.6%) and −0.1% ± 0.5% (range −1.6% to 2.1%) for the 6MV and 6MV FFF beams, respectively. The measured output factors were largely within 2% of the scintillator, except for the 5 mm 6MV beam showing a 3.2% deviation. The 2%/1 mm gamma analysis of composite SRS measurements produced the 97.2 ± 1.3% (range 95.8-98.5%) average passing rate against film. Submillimeter (≤0.5 mm) dose profile alignment with film was demonstrated in all cases.