Abstract
Low temperature epitaxy of Ge quantum dots on Si (100) - (2×1) by femtosecond pulsed laser deposition under femtosecond laser excitation was investigated. Reflection high-energy electron diffraction and atomic force microscopy were used to analyze the growth mode and morphology. Epitaxial growth was achieved at ∼70 °C by using femtosecond laser excitation of the substrate. A purely electronic mechanism of enhanced surface diffusion of the Ge adatoms is proposed. © 2011 American Institute of Physics.
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CITATION STYLE
Er, A. O., Ren, W., & Elsayed-Ali, H. E. (2011). Low temperature epitaxial growth of Ge quantum dot on Si (100) - (2×1) by femtosecond laser excitation. Applied Physics Letters, 98(1). https://doi.org/10.1063/1.3537813
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