The continuos shrinking of semiconductor's nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the effect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper proposes a new approach to automate this procedure exploiting a dedicated genetic algorithm. © 2011 Springer-Verlag.
CITATION STYLE
Di Carlo, S., Politano, G., Prinetto, P., Savino, A., & Scionti, A. (2011). Genetic defect based march test generation for SRAM. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 6625 LNCS, pp. 141–150). https://doi.org/10.1007/978-3-642-20520-0_15
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