Abstract
In this work we analyze the relation between the interface microroughness and the full width at half maximum (FWHM) of the photoluminescence (PL) spectra for a GaAs/Ga0.7Al0.3As multiple quantum well (QW) system. We show that, in spite of the complex correlation between the microscopic interface-defects parameters and the QW optical properties, the Singh and Bajaj model [Appl. Phys. Lett. 44, 805 (1984)] provides a good quantitative description of the excitonic PL-FWHM. © 1999 American Physical Society.
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CITATION STYLE
de Oliveira, J. B. B., Meneses, E. A., & da Silva, E. C. F. (1999). Magneto-optical studies of the correlation between interface microroughness parameters and the photoluminescence line shape in GaAs/Ga0.7Al0.3As quantum wells. Physical Review B - Condensed Matter and Materials Physics, 60(3), 1519–1522. https://doi.org/10.1103/PhysRevB.60.1519
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