A synchrotron X-ray diffraction study of strain and microstrain distributions in α-Zr caused by hydride precipitation

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Abstract

A thin zirconium hydride layer was deposited electrolytically on a hot-rolled and annealed Zr-2.5 wt.% Nb material. Changes in the α-Zr phase associated with the hydride precipitation were studied by synchrotron X-ray diffraction. Strain variations and the dislocation density in the α-Zr matrix were estimated from changes in diffraction peak positions and using X-ray Line Profile Analysis, respectively. It was shown that the dislocation density increased measurably in the α-Zr matrix due to the precipitation of the hydrides which corroborates previous transmission electron microscopy (TEM) observations indicating that the α-Zr accommodates some of the volume misfit by plastic deformation. The probable strain profile in the Zr-H system as a function of tested layer thickness is discussed.

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Shiman, O. V., Balogh, L., & Daymond, M. R. (2019). A synchrotron X-ray diffraction study of strain and microstrain distributions in α-Zr caused by hydride precipitation. Surfaces and Interfaces, 17. https://doi.org/10.1016/j.surfin.2019.100388

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