Determinación de las constantes ópticas y el espesor de materiales holográficos

Abstract

A technique to evaluate the refractive index, the absorption coefficient and the thickness of holographic recording materials is presented. The materials are in the form of a thin layer of film deposited on a thick glass plate. The experimental reflectances of p-polarized light are measured as a function of the incident angle, and the values of refractive index, thickness and absorption coefficient of the layer are obtained using the theoretical equation for reflectance. As examples, holographic silver halide emulsions and photopolymers are analyzed. The agreement between the calculated reflectances, using the thickness and refractive index obtained, and the measured reflectances is satisfactory.