Abstract
… hundreds of gigabytes in minutes and 4D STEM diffraction can generate data even faster. … potentials and electric fields from a 4D STEM diffraction data set. Processing and analysis …
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CITATION STYLE
APA
Meyer, C., Dellby, N., Hachtel, J. A., Lovejoy, T., Mittelberger, A., & Krivanek, O. (2019). Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python. Microscopy and Microanalysis, 25(S2), 122–123. https://doi.org/10.1017/s143192761900134x
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