The effect of thickness on the structural and optical properties of nano Ge-Te-Cu films

6Citations
Citations of this article
9Readers
Mendeley users who have this article in their library.

Abstract

Quartz was used as a substrate to hold different film thicknesses of Ge0.15Te0.78Cu0.07 within range 100–500 nm prepared by thermal evaporation technique. Films are still amorphous up to 200 nm and turn to more ordered nano polycrystalline one by ascending the values of film thickness up to 500 nm. Films turn to crystalline phase due to annealing. The relation of resistance and temperature shows phase transformation. Optical constants; refractive index, n absorption coefficient, α single-oscillator energy, Eo dispersion energy, Ed lattice dielectric constant, εL infinite wavelength dielectric constant, ε∞ the ratio of the carrier concentration to the effective mass, N/m∗ optical conductivity, σ and energy loss function, ELF show decreasing values with thickness up to 200 nm followed by ascending values within range 200–500 nm. It is concluded that the thickness range 100–200 nm introduces more disordered films while 200–500 nm introduces more ordered one.

Cite

CITATION STYLE

APA

El-Denglawey, A., Makhlouf, M. M., & Dongol, M. (2018). The effect of thickness on the structural and optical properties of nano Ge-Te-Cu films. Results in Physics, 10, 714–720. https://doi.org/10.1016/j.rinp.2018.07.023

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free