Bandwidth enhancement in an InGaN/GaN three-section superluminescent diode for optical coherence tomography

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Abstract

In this paper, the optoelectronic properties of InGaN-based blue (430 nm) superluminescent light-emitting diodes with a multi-section, three contact design are reported. The bias conditions of the rear absorber section and gain sections are explored in terms of enhancing and maximizing spectral bandwidth. We demonstrate that broader emission can be obtained with a short circuit, rather than an open circuit absorber section, and with two active regions at different current densities as opposed to a single active contact. Under optimal drive conditions, a -3 dB linewidth of 20 nm is obtained at 430 nm. Analysis of the device emission spectrum indicates that an axial resolution of ∼3.4 μm may be obtained in an optical coherence tomography system.

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Goldberg, G. R., Kim, D. H., Taylor, R. J. E., Childs, D. T. D., Ivanov, P., Ozaki, N., … Hogg, R. A. (2020). Bandwidth enhancement in an InGaN/GaN three-section superluminescent diode for optical coherence tomography. Applied Physics Letters, 117(6). https://doi.org/10.1063/5.0010795

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