Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures

N Gauquelin; M Couillard; H Zhang; J Wei; G Botton

Journal ArticleOPEN ACCESS

Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures

Gauquelin N
Couillard M
Zhang H
et al.

Microscopy and Microanalysis (2011) 17(S2) 1320-1321

DOI: 10.1017/s1431927611007471

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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APA

Gauquelin, N., Couillard, M., Zhang, H., Wei, J., & Botton, G. (2011). Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures. Microscopy and Microanalysis, 17(S2), 1320–1321. https://doi.org/10.1017/s1431927611007471

Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures

Abstract

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