Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling

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Abstract

Low repetition rate lasers are suitable for studying nonlinear optical phenomena, while near-field microscopy allows high spatial resolution for nanomaterial characterisation. Here, Wang et al. enable scattering-type near-field microscopy with low repetition rate lasers through phase-domain sampling.

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Wang, H., Wang, L., & Xu, X. G. (2016). Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling. Nature Communications, 7. https://doi.org/10.1038/ncomms13212

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