SXD, the single-crystal diffractometer at the ISIS spallation neutron source, uses an array of two-dimensional position-sensitive detectors and the neutron time-of-flight technique to measure diffraction data throughout very large volumes of reciprocal space for each fixed orientation of a single-crystal sample. This paper describes SXD in detail, following major improvements to the instrument. Particular emphasis is placed on the range of science possible, using recent results as examples, and the opportunities for future experiments.
Keen, D. A., Gutmann, M. J., & Wilson, C. C. (2006). SXD – the single-crystal diffractometer at the ISIS spallation neutron source. Journal of Applied Crystallography, 39(5), 714–722. https://doi.org/10.1107/s0021889806025921