A collection of papers related to in-situ TEM probing (just join and add). This in situ method utilize a scanning probe microscope inside a transmission electron microscope (TEM) to probe single structures such as a nanowire or a carbon nanotube. Electrical, mechanical, optical or other properties may be probed while the TEM provide all the microstructure characterizations. This method is also called TEMSPM, TEM-STM, STM-TEM, TEM-AFM or in-situ TEM nanoindentation depending on the particular probe used.
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