Experiments have been carried out to gain some further insight into the annealing behaviour of latent damage trails in Solid State Nuclear Track Detectors (SSNTDs). The results indicate that on annealing, (a) a latent damage trail shrinks both radially and axially thus causing a decrease in the etchable range and an increase in θc, the critical angle of etching, and (b) the decrease in the number density of tracks in the initial stages of the annealing process is mainly due to the disappearance of oblique tracks. © 1973.
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