Diffusion-induced grain boundary migration and associated concentration profiles in a CuZn alloy

  • Guan Z
  • Liu G
  • Williams D
 et al. 
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Abstract

Diffusion-induced grain boundary migration (DIGM) and diffusion-induced recrystallization (DIR) with their associated concentration profiles occurring in a CuZn alloy have been studied by Electron Probe Micro Analysis and Analytical Electron Microscopy. Both DIGM and DIR occurred in Cu when Zn was diffused in along the grain boundaries at 480 and 400°C. The Zn concentration was high in DIR regions (2-~20% Zn) and low in DIGM regions (

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Authors

  • Z. M. Guan

  • G. X. Liu

  • D. B. Williams

  • M. R. Notis

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