A method for improving the accuracy of simple ellipsometers of the fixed retarder and fixed angle of incidence type is presented. All the appratus parameters affecting measurement accuracy-the retarder characteristics, the azimuthal alignment of the polarizer, analyser and retarder and the angle of incidence-can be checked and numerically aligned using only a number of measurement results. The method can be performed with a desk computer does not require alignment tools or standards. © 1979.
Riedling, K. (1979). Evaluation of adjustment data for simple ellipsometers. Thin Solid Films, 61(3), 335–340. https://doi.org/10.1016/0040-6090(79)90478-4