Diffusion was studied in (fcc) Ni / (hcp) Ti multilayers in the temperature range 453 - 513 K by using low angle X-ray scattering (LAXS). Diffusion coefficients ranging from 0.6 10-24to 7 10-24m2s-1were obtained for multilayers with a composition modulation wavelength of 35, 80 and 110 Å. These measurements suggest diffusion induced solid state amorphization reaction (SSAR) with a low activation energy. It was observed that amorphization does not follow entirely the layer growth model. © 1991.
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