Diffusion was studied in (fcc) Ni / (hcp) Ti multilayers in the temperature range 453 - 513 K by using low angle X-ray scattering (LAXS). Diffusion coefficients ranging from 0.6 10-24to 7 10-24m2s-1were obtained for multilayers with a composition modulation wavelength of 35, 80 and 110 Å. These measurements suggest diffusion induced solid state amorphization reaction (SSAR) with a low activation energy. It was observed that amorphization does not follow entirely the layer growth model. © 1991.
Bouhki, M., Bruson, A., & Guilmin, P. (1991). Interdiffusion and amorphization in Ni/Ti multilayers. Solid State Communications, 79(5), 389–393. https://doi.org/10.1016/0038-1098(91)90490-M