We have developed and are in the process of testing an ion time-of-flight (TOF) detector system for use in our ion microtomography measurements. Using TOF, ion energy is determined by measurement of the ion's flight time over a certain path length. For ion microtomography, the principle advantage of TOF analysis is that ion count rates of several hundred thousand counts per second can be achieved as compared to a limit of about ten thousand ions per second when using a solid-state silicon surface barrier detector and associated electronics. This greater than 10-fold increase in count rate correspondingly shortens sample analysis time or increases the amount of data that can be collected on a given sample. © 1993.
Roberts, M. L., Heikkinen, D. W., & Proctor, I. D. (1993). Ion microtomography using ion time-of-flight. Nuclear Inst. and Methods in Physics Research, B, 77(1–4), 225–228. https://doi.org/10.1016/0168-583X(93)95547-I