I(V) computational coduction model for a SiC-6H Schottky diode

  • Benmaza H
  • Akkal B
  • Anani M
 et al. 
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Abstract

A computational model has been developed in order to explain the anomalies observed in the direct SiC-6H I(V) characteristic diode. These irregularities consist in a thermionic, a generation-recombination, a tunnelling and a leakage electric current contributions. Two kinds of diode's dimensions have been used. For the small one, a good fitting, at all temperatures has been obtained, but for the big one, the fitting was relatively bad, perhaps due to a so important parasite resistance versus potential variation. Even, a high parasite resistance has been encountered near room temperature. From the Richardson plot, it has been extracted a value of the Richardson constant A* very smaller than the theoretical value. A value of the barrier height has also been evaluated. © 2008 Elsevier B.V. All rights reserved.

Author-supplied keywords

  • Richardson constant
  • Schottky diode
  • SiC-6H diode
  • Thermionic current

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