We present a scanning near-field optical microscope operating in reflection suitable for simultaneous bright field and fluorescence imaging. A non-coated pulled optical fibre is used in true reflection mode, i.e. both as emitter and collector. Beam splitters, dichroic mirrors and polarisers are combined to discriminate the different wavelength and polarisation signals. The distance between fibre and sample is controlled by shear force feedback. Bright field and fluorescence images with polarisation contrast of dielectric samples have been obtained with 200 nm lateral resolution. We show the fluorescence polarisation dependence with the molecular orientation in application to Langmuir-Blodgett thin film domains. © 1995.
Jalocha, A., Moers, M. H. P., Ruiter, A. G. T., & van Hulst, N. F. (1995). Multi-detection and polarisation contrast in scanning near-field optical microscopy in reflection. Ultramicroscopy, 61(1–4), 221–226. https://doi.org/10.1890/070220