Optical parameters in ZnO nanocrystalline textured films grow on p-InP (100) substrates

19Citations
Citations of this article
6Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Spectroscopic ellipsometry measurements on ZnO nanocrystalline textured films grown on p-InP (100) substrates by using radio-frequency magnetron sputtering at room temperature were carried out to investigate their optical parameters. Transmission electron microscopy measurements showed that ZnO thin films grown on p-InP (100) substrates were nanocrystalline. The dielectric function, the refractive indice, and the extinction coefficient of the ZnO thin films were determined as functions of the photon energy, and the energy gap of the ZnO nanocrystalline film was 3.38eV. These results can help to improve the understanding of the ZnO nanocrystalline thin film grown on p-InP (100) substrates for potential use in optoelectronic devices based on InP substrates. © 2003 Elsevier Ltd. All rights reserved.

Cite

CITATION STYLE

APA

Kim, T. W., Kwack, K. D., Kim, H. K., Yoon, Y. S., Bahang, J. H., & Park, H. L. (2003). Optical parameters in ZnO nanocrystalline textured films grow on p-InP (100) substrates. Solid State Communications, 127(9–10), 635–638. https://doi.org/10.1016/S0038-1098(03)00565-9

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free