Parity-unfavored transitions in resonant photoemission from Ar, Kr, and Xe: experimental and theoretical results

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Abstract

High-resolution angle-resolved electron spectroscopy with synchrotron radiation has been used to study the angular distributions of resonant-Auger processes near the core-level thresholds Ar2p, Kr3d and Xe4d. Angular-distribution parameters (β) were measured for all resolved peak in the electron spectra and large negative values of β were found for some peaks. A quantitative method for calculating the angular-distribution parameters is described and results of calculations for the Ar2p3 2→4s resonant-Auger spectrum are compared with the experimental results. © 1990.

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Cooper, J. W., Lindle, D. W., Carlson, T. A., Mullins, D. R., Beall, C. E., Yates, B. W., … Grimm, F. A. (1990). Parity-unfavored transitions in resonant photoemission from Ar, Kr, and Xe: experimental and theoretical results. Journal of Electron Spectroscopy and Related Phenomena, 51(C), 397–406. https://doi.org/10.1016/0368-2048(90)80170-F

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