Photoemission microscopy for surface states of copper measured at different photoelectron energies

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Abstract

We have applied microspot photoemission spectroscopy to the surface imaging of a polycrystalline Cu plate with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The images of the crystalline islands with the (1 1 1) surface were measured by detecting photoelectrons due to the Shockley surface state (SS) and the sp-band specific to the (1 1 1) surface. The dependence of the images on the photoelectron energies was related to the mean length of the (1 1 1) terrace. The (1 1 1) island measured with the photoelectron close to the work function cutoff was found to be shifted from that measured with the Shockley state. The result demonstrates that the very high-energy resolution is essential for precise understanding of the surface images. © 2005 Elsevier B.V. All right reserved.

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Sugiyama, T., Aida, M., Ueno, N., & Munakata, T. (2005). Photoemission microscopy for surface states of copper measured at different photoelectron energies. In Journal of Electron Spectroscopy and Related Phenomena (Vol. 144–147, pp. 1167–1169). https://doi.org/10.1016/j.elspec.2005.01.245

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