Rutherford back scattering (RBS) and elastic nuclear resonance (non-RBS resonance scattering of 3.05 MeV α-particles from oxygen atoms of a sample, for example) have been used for non-destructive characterization of differently fired samples of cadmium oxide (a II-VI semiconductor), Bi2Sr2CaCu2O(8+x)and (Bi0.92Pb0.17)2Sr2CaCu2O(8+x)high temperature superconductors, and practically useful films of a composite of diamond nanoparticles and Si-O made by CV deposition on Si substrate. In the RBS spectrum, steps for light elements like O and Ca are practically not visible, while steps for heavy elements like Bi and Cd are clear and large. In contrast, there is a clear resonance peak due to oxygen allowing easy detection of oxygen in a sample. Most important of our present RBS findings is reduction of O-content from cadmium oxide on firing (here for 36 h) at higher and higher temperatures up to 800 °C. Large variations of room temperature (300 K) electrical resistivity of CdO after heat treatments at different temperatures for 36 h have been explained on basis of variation in O-content. Its room temperature resistivity of 26.4 mΩcm for firing at 275 °C reduces to only 2.15 mΩcm for firing at 800 °C. © 2003 Elsevier B.V. All rights reserved.
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