A novel lithography technique for fabricating ferromagnetic metal/oxide-based electron devices was investigated using scanning probe microscope (SPM) oxidation process. This technique was applied to the surface modification of Ni thin films, and planar-type Ni/Ni oxide/Ni diodes were fabricated. Ni-based diodes clearly showed nonlinear current-voltage (I-V) characteristics. © 2003 Elsevier B.V. All rights reserved.
CITATION STYLE
Shirakashi, J. I., & Takemura, Y. (2004). SPM fabrication of nanometerscale ferromagnetic metal-oxide devices. Journal of Magnetism and Magnetic Materials, 272–276, 1581–1583. https://doi.org/10.1016/j.jmmm.2003.12.308
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