Static structure factor S(Q) of partially deuterated ethyl- and hexylmethacrylate polymers

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Abstract

We have performed measurements of the static structure factor S(Q) on Polyethylmethacrylate and Polyhexylmethacrylate on ROTAX at ambient T in the Q-range 0.5<Q/angstrom-1<4.5 and on the DNS spectrometer at T = 8 K in the Q-range 0.1 <Q/angstrom-1<3.2 thereby including spin polarization analysis. Each polymer was either deuterated at the side (-ester) chain or at the main chain giving rise to vastly different partial structure factors. Possible correlations to the structure are given.

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Meier, G., Pawelzik, U., Schweika, W., & Kockelmann, W. (2000). Static structure factor S(Q) of partially deuterated ethyl- and hexylmethacrylate polymers. Physica B: Condensed Matter, 276278, 369–370. https://doi.org/10.1016/S0921-4526(99)01607-5

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