Surface diffusion lenght during MOMBE and CBE growth measured by μ-RHEED

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Abstract

The growth rates of layers grown on a mesa-etched (001) GaAs surface were measured by in-situ scanning microprobe reflection high-energy electron diffraction (μ-RHEED) from the period of the RHEED intensity oscillation in real time. The diffusion lenght of the surface adatoms of column III elements was determined from the gradient of the variation of the growth rates in the cases of MBE, MOMBE using trimethylgallium (TMGa) and CBE using TMGa or triethylgallium (TEGa) and arsine (AsH3). The obtained values of the diffusion lengths were of the order of a micrometer in every case of the source-material combination. In the case of metalorganic materials as Ga source, it was found that the diffusion length was larger than that of Ga atom from metal Ga source. Since the substrate temperature of the present experiment is high enough to decompose TMGa and TEGa on the surface, Ga adatoms are considered to be responsible to the surface diffusion. Therefore, it is considered that the derivatives of the metalorganic molecules such as methyl radicals affect the diffusion of Ga adatoms. © 1992.

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APA

Isu, T., Hata, M., Morishita, Y., Nomura, Y., Goto, S., & Katayama, Y. (1992). Surface diffusion lenght during MOMBE and CBE growth measured by μ-RHEED. Journal of Crystal Growth, 120(1–4), 45–49. https://doi.org/10.1016/0022-0248(92)90362-M

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