Target characterization by fast ion impact

  • Lorenzen P
  • Rothard H
  • Kroneberger K
 et al. 
  • 2

    Readers

    Mendeley users who have this article in their library.
  • 0

    Citations

    Citations of this article.

Abstract

Accelerator based, easily accessible methods are discussed to control and characterize targets and their surfaces by (MeV) ion impact. Independent, but simultaneously applicable techniques such as Rutherford backscattering (RBS), elastic recoil detection (ERD), secondary electron emission (SEE), ion induced Auger electron spectroscopy (IIAES), and particle induced X-ray emission (PIXE) will be shown as tools for bulk and surface analyses. We also present studies of the transformation of the surface conditions, e.g. surface cleaning and smoothing under UHV conditions by heavy-ion sputtering. Possibilities, limitations, and sensitivities of the techniques are discussed. © 1989.

Get free article suggestions today

Mendeley saves you time finding and organizing research

Sign up here
Already have an account ?Sign in

Find this document

Authors

Cite this document

Choose a citation style from the tabs below

Save time finding and organizing research with Mendeley

Sign up for free