Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique

  • Feng Y
  • Jiang T
  • Sun J
 et al. 
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Abstract

We report a scanning microwave near-field microscope that allows temperature-dependent local electromagnetic characterization of electronic materials. We have established a temperature-controlled sample stage cooled by liquid nitrogen, so that the local electromagnetic properties of the sample could be studied through near-field microwave interaction at temperature varying from 80 to 300 K. Using this instrument, we have studied the magnetic phase transition of an Nd0.7Sr0.3MnO3-δthin film and an ion-pair complex magnetic material, as well as the homogeneity of the microwave surface resistance of a YBa2Cu3O7-δsuperconducting thin film. Experiment results have demonstrated the ability of temperature-dependent local microwave characterization of this microwave microscope for different kind of electronic materials. © 2005 Elsevier B.V. All rights reserved.

Author-supplied keywords

  • Magnetic materials
  • Microwave near-field microscopy
  • Superconductivity materials

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Authors

  • Y. J. Feng

  • T. Jiang

  • J. Sun

  • L. Y. Wu

  • K. L. Wang

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