Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique

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Abstract

We report a scanning microwave near-field microscope that allows temperature-dependent local electromagnetic characterization of electronic materials. We have established a temperature-controlled sample stage cooled by liquid nitrogen, so that the local electromagnetic properties of the sample could be studied through near-field microwave interaction at temperature varying from 80 to 300 K. Using this instrument, we have studied the magnetic phase transition of an Nd0.7Sr0.3MnO3-δthin film and an ion-pair complex magnetic material, as well as the homogeneity of the microwave surface resistance of a YBa2Cu3O7-δsuperconducting thin film. Experiment results have demonstrated the ability of temperature-dependent local microwave characterization of this microwave microscope for different kind of electronic materials. © 2005 Elsevier B.V. All rights reserved.

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Feng, Y. J., Jiang, T., Sun, J., Wu, L. Y., & Wang, K. L. (2005). Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique. Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 122(1), 49–54. https://doi.org/10.1016/j.mseb.2005.04.017

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