A variant to the 'random approximation' of the reference-free alignment algorithm

  • Marco S
  • Chagoyen M
  • De La Fraga L
 et al. 
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Abstract

Single-particle averaging from electron microscope images strongly depends on alignment. Most alignment procedures are based on cross:correlation of an initial reference image with the rest of the population, leading to a clear pattern dependence. Among the different approaches that have been proposed to minimize this problem, one of the most widely used is the so-called iterative reference-free alignment algorithm (RFAA), proposed by Penczek et al. [Ultramicroscopy 40 (1992) 33]. To avoid the pattern dependence shown by the initial 'random approximation' step of this method, we propose a variant of the algorithm that is more independent of the input order of the initial images and which could substitute the random initialization of the RFAA.

Author-supplied keywords

  • Electron microscopy
  • Image processing

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Authors

  • Sergio Marco

  • Mónica Chagoyen

  • Luis Gerardo De La Fraga

  • Jose Maria Carazo

  • Jose L. Carrascosa

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