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Albert Crespo-Yepes

  • PhD on Electronics Engineering
  • Post doctoral Researcher
  • Universitat Autònoma de Barcelona
  • 12h-indexImpact measure calculated using publication and citation counts. Updated daily.
  • 644CitationsNumber of citations received by Albert's publications. Updated daily.

About

Albert Crespo Yepes, born in Barcelona (1982), he received the degree in Telecomunications Engineering in 2008 for UAB (Universitat Autònoma de Barcelona). In 2009 he obtained the master in micro and nano electronics. Recently (2012), he finalized his Ph. D. studies in Electronic Engineering in the group of Reliability Electron DEvices and Cricuits in the Electronic Department of the Universitat Autònoma de Barcelona (UAB). Currently, he is post-Ph.D. researcher in this group. His work is focused on the study of Dielectric Breakdown and Breakdown Reversibility characterization in MOS transistors with ultrathin high-k gate stack, and also on Resistive Switching phenomenon that is being widely studied for applications in the field of non-volatile memories. Furthermore, is also working on Channel Hot-Carriers (CHC) and Bias Temperature Instability (BTI) as a reliability limitation for next generation CMOS devices.

Recent publications

  • High-k dielectrics and metal gates for future generation memory devices

    • Kittl J
    • Opsomer K
    • Popovici M
    • et al.
    N/AReaders
    12Citations
  • High-k dielectrics for future generation memory devices (Invited Paper)

    • Kittl J
    • Opsomer K
    • Popovici M
    • et al.
    N/AReaders
    163Citations

Professional experience

Post doctoral Researcher

Universitat Autònoma de Barcelona

February 2013 - Present

Education

PhD on Electronics Engineering

Universitat Autònoma de Barcelona

September 2008 - December 2012(4 years)

Master of micro and nano Electronics

Universitat Autònoma de Barcelona

September 2008 - September 2009(a year)

Telecommunication Engineer

Universitat Autònoma de Barcelona

September 2002 - September 2008(6 years)

Co-authors (273)

  • Fernando García-Redondo
  • Peyman Pouyan
  • Francesc Moll