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Domingo Mery

    • 103PublicationsNumber of items in Domingo's My Publications folder on Mendeley.
    • 11Followers

    Recent publications

    • Active X-ray testing of Complex Objects

      • Riffo V
      • Mery D
    • Analysis of Mechanical Properties in Tortillas using Computer Vision

      • Matiacevich S
      • Inostroza M
      • Mery D
      • et al.


    Dr.-Ing. Elektrotechnik


    October 1996 - January 2001(4 years)

    Dipl.-Ing. Elektrotechnik

    Universität Karlsruhe (TH) - University of Karlsruhe

    October 1989 - March 1992(2 years)

    Ingeniero Electrónico

    Universidad Nacional de Ingenieria

    March 1984 - January 1989(5 years)

    Licenciado Ciencias de la Ingeniería

    Universidad Nacional de Ingenieria

    March 1984 - March 1988(4 years)


    Domingo Mery was born in Santiago de Chile in 1965. He received the Diploma (M.Sc.) degree in Electrical Engineering from the Technical University of Karlsruhe, Germany, in 1992, and the Ph.D. degree with distinction at the Technical University of Berlin, in 2000. He was a Research Scientist at the Institute for Measurement and Automation Technology at the Technical University of Berlin with the collaboration of YXLON X-Ray International. He was a recipient of a Scholarship from the Konrad-Adenauer-Foundation, and from a Scholarship from the German Academic Exchange Service (DAAD) for his Ph.D. work. He was Asociated Research in 2001 at the Department of Computer Engineering at the University of Santiago, Chile. Since 2004 he is Associate Professor at the Department of Computer Science at the Pontificia Universidad Católica de Chile, Chile. He was Chair of the Computer Science Department in 2005-2009. His research interests include image processing for fault detection in aluminum castings, X-ray imaging, real-time programming and computer vision. He is author of more than 45 technical SCI publications, and more than 40 conference papers. He was program chair of the 2007, 2009 Pacific-Rim Symposium on Image and Video Technology, and 2007 Iberoamerican Congress on Pattern Recognition. He served on the program committees of several conferences: PSIVT2006, I-SPAN 2009, WCC-2006, SCCC-2003, SCCC-2009. MICAI 2008, RobVis 2008, VIE 2007, CERMA 2008-2010, ACCV-2009-2010. He received the Ron Halmshaw Award, established for the best paper published in Insight Journal on industrial radiography.

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